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This is a friendly reminder of the quickly approaching paper submission deadline: March 23, 2015

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information --

Scope

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wear-out and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposi um is sponsored by the IEEE Council on Electronic Design Automation (CEDA) and the 2015 edition is organized by the IEEE Computer Society Test Technology Technical Council, the University of Athens, and the TIMA Laboratory.

The topics of interest include (but are not limited to) the following ones:

Reliability issues in nanometer technologies
On-line testing of analog and mixed signal circuits
Radiation effects
On-line testing in industry, automotive, railway, avionics, space
Design for reliability
On-line testing in the continuous operation of large systems
Design for variability
Field diagnosis, maintainability and reconfiguration
On-line power monitoring and control
Fault-tolerant and fail-safe systems
On-line current, temperature, etc, monitoring
Dependability evaluation
Secure circuit design
Dependable systems design
Fault-based attacks and counter measures
On-line and off-line built-in self-test
Self-checking circuits and coding theory
Synthesis of on-line testable circuits

Submissions

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The IOLTS Committee invites authors to submit papers in the above or related technical areas. Accepted papers and posters will be included in formal Proceedings to be published by the IEEE. Papers must be submitted electronically following the instructions provided at the symposium web site. Papers should be in the standard IEEE conferences double-column format. If accepted, regular papers should be allowed six pages in the IEEE proceedings of IOLTS.

Key Dates

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Submission deadline: March 23, 2015 – Notification of acceptance: May 4, 2015 – Camera-ready papers due: May 28, 2015

Additional Information

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GENERAL INFORMATION

Michael NICOLAIDIS

TIMA Laboratory - France

michael.nicolaidis@imag.fr

Antonis PASCHALIS

University of Athens - Greece

SUBMISSION INFORMATION

Dimitris Gizopoulos

University of Athens - Greece

dgizop@di.uoa.gr

Dan Alexandrescu

iRoC Technologies - France

dan.alexandrescu@iroctech.com

About the location:

IOLTS 2015 will be held at Elia in the middle leg of Halkidiki peninsula, where lush green forests reach right down to turquoise waters. Halkidiki offers unique sightseeing like the ancient city of Olynthus, the Petralona cave, important for its natural beauty and size as well as anthropological and paleontological interest, and Mount Athos, the world's only monastic state, untouched by the passing of time and a living monument to Byzantine culture.

For more information, visit us on the web at: http://tima.imag.fr/conferences/iolts

The 21st IEEE International On-Line Testing Symposium is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).